Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate
2006-10-31
2006-10-31
Smoot, Stephen W. (Department: 2813)
Active solid-state devices (e.g., transistors, solid-state diode
Test or calibration structure
C349S143000, C349S147000
Reexamination Certificate
active
07129520
ABSTRACT:
An LCD device includes a plurality of data pads; an LCD panel defined by a plurality of pad regions; a first shorting bar connected to odd numbered data pads among the plurality of data pads; a second shorting bar connected to even numbered data pads among the plurality of data pads; and a test pad formed in a predetermined portion of a pad region among the plurality of pad regions to apply a signal voltage for on/off testing to the first shorting bar and the second shorting bar.
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