Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate
2005-03-01
2005-03-01
Chaudhari, Chandra (Department: 2813)
Active solid-state devices (e.g., transistors, solid-state diode
Test or calibration structure
C257S059000
Reexamination Certificate
active
06861665
ABSTRACT:
An LCD device includes a plurality of data pads; an LCD panel defined by a plurality of pad regions; a first shorting bar connected to odd numbered data pads among the plurality of data pads; a second shorting bar connected to even numbered data pads among the plurality of data pads; and a test pad formed in a predetermined portion of a pad region among the plurality of pad regions to apply a signal voltage for on/off testing to the first shorting bar and the second shorting bar.
REFERENCES:
patent: 5068748 (1991-11-01), Ukai et al.
patent: 5497146 (1996-03-01), Hebiguchi
patent: 6128051 (2000-10-01), Kim et al.
patent: 6246074 (2001-06-01), Kim et al.
patent: 6287899 (2001-09-01), Park et al.
Chaudhari Chandra
LG.Philips LCD Co. , Ltd.
Morgan & Lewis & Bockius, LLP
Vesperman William
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