Line width check in layout database

Details Line width check in layout database Line width check in layout database

2006-09-12

2006-09-12

Siek, Vuthe (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Nanotechnology related integrated circuit design

Reexamination Certificate

active

07107554

ABSTRACT:
A machine-readable medium has a set of machine-readable instructions for causing a computer to perform a method. The method includes checking a layout having a layout line width for at least one line versus a schematic having a schematic line width for the at least one line. Extracting a line width property from the schematic and transferring the line width property to the layout are included in the method, as is checking a design for the at least one line versus the schematic.

REFERENCES:
patent: 5706295 (1998-01-01), Suzuki
patent: 5793643 (1998-08-01), Cai
patent: 5963729 (1999-10-01), Aji et al.
patent: 6038020 (2000-03-01), Tsukuda
patent: 6038383 (2000-03-01), Young et al.
patent: 6078737 (2000-06-01), Suzuki
patent: 6115546 (2000-09-01), Chevallier et al.
patent: 6295627 (2001-09-01), Gowni et al.
patent: 6425113 (2002-07-01), Anderson et al.
patent: 6446239 (2002-09-01), Markosian et al.
patent: 6470477 (2002-10-01), Scott
patent: 6516451 (2003-02-01), Patin
patent: 6546540 (2003-04-01), Igarashi et al.

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