Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-05-30
2006-05-30
Do, Thuan (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C716S030000
Reexamination Certificate
active
07055115
ABSTRACT:
A method of performing a design rule check on an integrated circuit includes tagging at least one line in a schematic with a width marker and an associated width parameter, extracting the line width marker and the associated line width parameter, comparing the extracted line width parameter with an actual design width for a design line, and generating an error condition when the actual design line width is less than the line width parameter.
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Ababei Adriana
Chevallier Christophe
Do Thuan
Leffert Jay & Polglaze
Micro)n Technology, Inc.
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