Active solid-state devices (e.g. – transistors – solid-state diode – Heterojunction device – With lattice constant mismatch
Reexamination Certificate
2005-12-27
2005-12-27
Jackson, Jerome (Department: 2815)
Active solid-state devices (e.g., transistors, solid-state diode
Heterojunction device
With lattice constant mismatch
C257S097000, C257S085000, C257S013000
Reexamination Certificate
active
06979844
ABSTRACT:
A low-resistance silicon baseplate (11) has formed thereon a buffer layer12in the form of an alternating lamination of AlN sublayers (12a) and GaN sublayers (12b). On this buffer layer there are formed an n-type semiconductor region (13) of gallium nitride, an active layer (14) of gallium indium nitride, and a p-type semiconductor region (15) of gallium nitride, in that order. An anode (17) is formed on the p-type semiconductor region (15), and a cathode (18) on the baseplate (11).
REFERENCES:
patent: 5831277 (1998-11-01), Razeghi
patent: 6110277 (2000-08-01), Braun
patent: 6255198 (2001-07-01), Linthicum et al.
patent: 6566677 (2003-05-01), Kano et al.
Kikuchi Masaaki
Moku Tetsuji
Ohtsuka Kohji
Yanagihara Masataka
Jackson Jerome
Sanken Electric Co. Ltd.
Woodcock & Washburn LLP
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