Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Radiation sensitive composition or product or process of making
Reexamination Certificate
2007-10-23
2007-10-23
Pezzuto, Helen L. (Department: 1713)
Radiation imagery chemistry: process, composition, or product th
Imaging affecting physical property of radiation sensitive...
Radiation sensitive composition or product or process of making
C526S271000, C526S280000, C526S284000
Reexamination Certificate
active
10963129
ABSTRACT:
Disclosed are a light absorbent agent polymer for organic anti-reflective coating which can prevent diffused light reflection of bottom film layer or substrate and reduce standing waves caused by a variation of thickness of the photoresist itself, thereby, increasing uniformity of the photoresist pattern, in a process for forming ultra-fine patterns of photoresist for photolithography by using 193 nm ArF among processes for manufacturing semiconductor devices, and its preparation method. Also, the present invention discloses an organic anti-reflective coating composition comprising a light absorbent agent polymer for the organic anti-reflective coating and a pattern formation process using the coating composition.
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patent: 6835532 (2004-12-01), Jung
patent: 7033729 (2006-04-01), Jung et al.
patent: 7160668 (2007-01-01), Jung et al.
Jung Jae Chang
Kim Jin-soo
Kong Keun Kyu
Hynix / Semiconductor Inc.
Marshall & Gerstein & Borun LLP
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