Level transfer circuit for LVCMOS applications

Electronic digital logic circuitry – Interface – Supply voltage level shifting

Reexamination Certificate

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Details

C326S081000, C326S068000, C327S333000

Reexamination Certificate

active

06265896

ABSTRACT:

FIELD OF THE INVENTION
This invention is related to level translation circuitry, and in particular, to a level translation circuit for use with low voltage CMOS circuitry.
BACKGROUND OF THE INVENTION
There are a number of situations when it is desirable to translate signals with small voltage swings into signals with larger voltage swings. For a differential input signal, the typical solution uses a sense amplifier (SA). In order to use the SA in the case of non-differential signals, a special reference voltage is needed. Typically, SA's are optimized for sensing very small signals at the expense of additional delay. Additionally, both the SA and the reference voltage generator may contain many transistors which may require a large circuit area.
FIG. 1
shows a typical circuit
100
used to provide level translation. The circuit
100
comprises NFETs
102
,
104
and
106
. The circuit
100
also comprises cross-coupled PFETs
108
and
110
, and PFET
112
. A serial connection is formed where the drain of the NFET
102
is coupled to the drain of the PFET
108
. The upper NFET
102
source and the lower NFET
104
drain are connected to the drain of the additional PFET
112
. The gate of the PFET
112
is connected to the gates of the NFET
102
and
104
, and to an input
114
. A reduced supply voltage (Vdd1) is fed to the source of this additional PFET
112
. The FETs
102
,
104
,
106
and
112
have small threshold voltages (0.2 * Vdd1) while the FETs
108
and
110
have large threshold voltages (0.2 * Vdd2), where Vdd2 is larger that Vdd1. while the FETs
108
and
110
have large threshold voltages (0.2 * Vdd2), where Vdd2 is larger that Vdd1.
The circuit
100
has significant problems regarding switching speed. In the quiescent state (where the output equals zero), the PFET
108
is opened and the gate of PFET
110
is charged to Vdd2. To switch on the PFET
110
, the capacitance of node
116
should be discharged to ground. Since the discharge current is the difference between the current through the NFET
102
and the current through the PFET
108
, the PFET
110
will hardly tum on, thereby resulting in a large turn on delay. Similarly, when the NFET
106
turns on, part of its drain current passes through PFET
110
instead of the output load (since the capacitance of the PFET
110
gate should be charged by the PFET
108
turned on by the NFET
106
) which then leads to a large turn off delay. This situation is typical for cases where the input and output stages have different power supplies.
The second drawback of the circuit
100
is that there are significant crowbar currents: through FETs
108
,
102
, and
104
during the switching on transition and through FETs
110
and
106
during switching off transition, thus wasting power. In addition, the small threshold of the NFET
106
contributes to a large leakage current in the off state thus increasing standby power.
SUMMARY OF THE INVENTION
A fully static level translation circuit having a standby power close to zero is provided by embodiments of the present invention. The circuit is controlled by small input voltage pulses (Vin<1V) and produces high output voltage pulses. In order to minimize switch-on time a self-reset circuit is included. The circuit may be used as a “word line” driver in RAM memories with two supply voltages, and in other applications where high speed pulse drivers are necessary.
In one embodiment of the present invention, a level translation circuit is provided for translating the voltage level of an input signal having a first voltage level to form an output signal having a second voltage level. The translation circuit comprises an input stage having logic to receive the input signal having the first voltage level and to create a first stage output signal, an output stage having logic to receive the first stage output signal and produce the output signal having the second voltage level, and a reset stage having logic to receive the first stage output signal and the output signal and to produce a reset stage output signal that is coupled to the output stage.


REFERENCES:
patent: 5315157 (1994-05-01), Koizumi
patent: 5321324 (1994-06-01), Hardee et al.
patent: 5422523 (1995-06-01), Roberts et al.
patent: 5434519 (1995-07-01), Trinh et al.
patent: 5635859 (1997-06-01), Yokota et al.
patent: 5650742 (1997-07-01), Hirano
patent: 5864251 (1999-01-01), Bloker et al.
patent: 5994944 (1999-11-01), Manyoki
patent: 6005432 (1999-12-01), Guo et al.
patent: 6137312 (2000-10-01), Manning
Lance A. Glasser and Daniel W. Dobberpuhl,The Design and Analysis of VLSI Circuits, Addison-Wesley Publishing Company 1985, pp. 294-295.
Mutoh, et al., A 1V Multi-Threshold Voltage CMOS DSP with an Efficient Power Management Technique for Mobile Phone Applications, ISSCC Digest of Technical Papers, pp. 168-169, Feb. 1996.
Date, et al., 1-V, 30-MHz Memory-Macrocell-Circuit Technology with a 0.5 &mgr;m Multi-threshold CMOS, IEEE Symposium on Low Power Electronics, pp. 90-91, 1994.
Takashima, et al., Standby/Active Mode Logic for Sub-1-V Operating ULSI Memory, IEEE Journal of Solid-State Circuits, vol. 29, No. 4, pp. 441-447, Apr. 1994.
Keith Diefendorff, Microprocessor Report, The Insiders' Guide to Microprocessor Hardware, The Russians Are Coming, Supercomputer Maker Elbrus Seeks to Join ×86/IA-64 Melee, Feb. 15, 1999, vol. 13, No. 2, pp. 1-7.

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