Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Mechanical measurement system
Reexamination Certificate
2008-09-16
2010-11-30
Bui, Bryan (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Mechanical measurement system
C367S135000, C324S644000
Reexamination Certificate
active
07844406
ABSTRACT:
To provide a simpler and less expensive system for multipoint level measurement, a level measurement system with at least two sensor devices operating in accordance with the pulse-echo principle and being connected via a communication network to a central signal processing device is provided. The computation-intensive evaluation of echo profiles for calculating distances or ranges is thus shifted from the sensor devices at the measurement locations or sites to the central signal processing device.
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patent: 7583562 (2009-09-01), Lyon
patent: 2004/0124854 (2004-07-01), Slezak
patent: 2004/0183550 (2004-09-01), Fehrenbach et al.
patent: 2 342 996 (2000-04-01), None
patent: WO 96/07875 (1996-03-01), None
Bui Bryan
Siemens Milltronics Process Instruments Inc.
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