Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2011-03-15
2011-03-15
Lebentritt, Michael S (Department: 2829)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S341000, C257S346000, C257S401000, C257S409000, C257SE21427, C257SE29062, C257SE29064, C257SE29256, C257SE29258, C257SE29268
Reexamination Certificate
active
07906810
ABSTRACT:
A LDMOS device for an ESD protection circuit is provided. The LDMOS device includes a substrate of a first conductivity type, a deep well region of a second conductivity type, a body region of the first conductivity type, first and second doped regions of the second conductivity type, and a gate electrode. The deep well region is disposed in the substrate. The body region and the first doped region are respectively disposed in the deep well region. The second doped region is disposed in the body region. The gate electrode is disposed on the deep well region between the first and second doped regions. It is noted that the body region does not include a doped region of the first conductivity type having a different doped concentration from the body region.
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Tang Tien-Hao
Wang Chang-Tzu
King Justin
Lebentritt Michael S
United Microelectronics Corp.
WPAT, PC
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