Layout of semiconductor device with substrate-triggered ESD...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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C257S356000, C257SE29012

Reexamination Certificate

active

10904214

ABSTRACT:
A semiconductor device with substrate-triggered ESD protection has a guard ring, a first MOS transistor array, a second MOS transistor array, a substrate-triggered portion, and an N-well. The first MOS transistor array, the second MOS transistor array, the substrate-triggered portion, and the N-well are formed in a region surrounded by the guard ring, and the substrate-triggered portion is located between the first MOS transistor array and the second MOS transistor array. When the ESD event occurs, the N-well is biased for directing a trigger current.

REFERENCES:
patent: 6576958 (2003-06-01), Ker et al.
patent: 6639283 (2003-10-01), Hung et al.
patent: 2003/0047786 (2003-03-01), Lee et al.
patent: 2003/0197246 (2003-10-01), Ker et al.
patent: 2004/0031998 (2004-02-01), Chen et al.
patent: 2004/0051146 (2004-03-01), Ker et al.
patent: 2004/0052020 (2004-03-01), Ker et al.
patent: 2004/0070900 (2004-04-01), Ker et al.

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