Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-10-03
2006-10-03
Do, Thuan (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000
Reexamination Certificate
active
07117459
ABSTRACT:
A layout check system checks whether a layout of a power source, a component including a power pin, and a bypass capacitor on a PCB and defined by layout data created using a CAD system allows the bypass capacitor to function effectively. A storage unit stores the layout data that includes information used as a basis to calculate a first value corresponding to impedance between the power pin and the power source and a second value corresponding to impedance between the power pin and the bypass capacitor. A calculation unit calculates the first value and the second value with use of the information. A judgment unit judges whether the layout allows the bypass capacitor to function effectively, by comparing the first value with the second value. When a result of the judgment is negative, an output unit outputs error information.
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Mimura Syoichi
Tanimoto Shin-ichi
Do Thuan
Levin Naum
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