Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-04-18
2006-04-18
Dinh, Paul (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C716S030000
Reexamination Certificate
active
07032205
ABSTRACT:
It is determined whether a short-run rule can be adapted into a position, where a via cell is parallel and adjacent to a portion of wiring or another via cell. The via cell and the portion of the wiring is arrayed at the smallest space in the wiring. When determined that the short-run rule can be adapted thereinto, via cell data is created. The via cell data includes a via margin which is so reduced in size that the via margin can be equal to or larger than the wiring minimum space. With the created via cell data, automatic layout and wiring is performed. The via cell data is replaced with art-work data including a via cell with an original via margin, so as to be output.
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Dinh Paul
Foley & Lardner LLP
NEC Electronics Corporation
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