Lateral temperature equalizing system for large area...

Adhesive bonding and miscellaneous chemical manufacture – Differential fluid etching apparatus – With workpiece support

Reexamination Certificate

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Details

C118S715000, C118S724000, C118S725000

Reexamination Certificate

active

07442275

ABSTRACT:
In many processes used in fabricating semiconductors the wafer is seated on the top surface of a pedestal and heated in a high energy process step, such as plasma etching. The pedestal, chuck or platen may be cooling but the wafer gradually heats until the process can no longer continue. Where large, e.g. 300 mm diameter, wafers are being processed the temperature level across the wafer is difficult to maintain substantially constant. In this system and method the lateral temperature distribution is equalized by a heat sink structure in a chamber immediately under the wafer support on top of the pedestal. A number of spatially distributed wicking posts extend downwardly from a layer of wicking material across the top of the chamber, into a pool of a vaporizable liquid. At hot spots, vaporized liquid is generated and transported to adjacent condensation posts extending up from the liquid. The system thus passively extracts heat to equalize temperatures while recirculating liquid and assuring adequate supply. The free volume above and within the liquid, and the short distances between posts, assure adequate heat transfer rates.

REFERENCES:
patent: 4853100 (1989-08-01), Hsu
patent: 4880053 (1989-11-01), Sheyman
patent: 5556500 (1996-09-01), Hasegawa et al.
patent: 5609720 (1997-03-01), Lenz et al.
patent: 5769154 (1998-06-01), Adkins et al.
patent: 6237223 (2001-05-01), McCullough
patent: 6736206 (2004-05-01), Hisai
patent: 59019328 (1984-01-01), None

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