Active solid-state devices (e.g. – transistors – solid-state diode – Bulk effect device – Bulk effect switching in amorphous material
Reexamination Certificate
2006-05-17
2009-12-01
Loke, Steven (Department: 2818)
Active solid-state devices (e.g., transistors, solid-state diode
Bulk effect device
Bulk effect switching in amorphous material
C438S102000
Reexamination Certificate
active
07626191
ABSTRACT:
A lateral phase change memory with spacer electrodes and method of manufacturing the same are provided. The memory is formed by connecting the conductive electrodes with lower resistivity and the spacer electrodes with higher resistivity, and filling the phase change material between the spacer electrodes. Therefore, the area that the phase change material contacts the spacer electrodes and the volume of the phase change material can be reduced; thereby the programming current and power consumption of the phase change memory are reduced.
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Chao Te-Sheng
Chen Wei-Su
Chen Yi-Chan
Chuo Yen
Hsu Hong-Hui
Chi Suberr
Industrial Technology Research Institute
Loke Steven
Rabin & Berdo P.C.
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