Latch-up analysis and parameter modification

Details Latch-up analysis and parameter modification Latch-up analysis and parameter modification

2006-02-07

2006-02-07

Siek, Vuthe (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Nanotechnology related integrated circuit design

Reexamination Certificate

active

06996786

ABSTRACT:
A latch-up analysis and parameter modification system, method and program product that analyzes a circuit design for latch-up sensitivity and allows for modifications of the circuit design to avoid latch-up of the circuit while improving the density and overall performance of the circuit are disclosed. Latch-up of a circuit design is analyzed through identifying an injector source and a collector circuit, at least one of the injector source and the collector circuit having a parameter, providing latch-up criteria for the collector circuit, and determining latch-up sensitivity of the collector circuit based on the latch-up criteria and the parameter. Then, the parameter may be modified to adjust latch-up sensitivity, and latch-up sensitivity of the collector circuit is determined based on the latch-up criteria and the modified parameter.

REFERENCES:
patent: 5982021 (1999-11-01), Verma
patent: 6165848 (2000-12-01), Thiemann
patent: 6329692 (2001-12-01), Smith
patent: 6553542 (2003-04-01), Ramaswamy et al.
patent: 2003/0229730 (2003-12-01), Pedrazzini et al.

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