Latch modeling technique for formal verification

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C716S030000, C716S030000

Reexamination Certificate

active

11051109

ABSTRACT:
A method for formal verification includes a latch remodeling process to reduce computational requirements for clock modeling. Latches that exhibit flip flop-like output behavior in a synthesized layout of sequential logic are identified and replaced with flip flops to generate a remodeled layout. This latch replacement can be performed using rules that filter out latches that do not exhibit flip flop-like output behavior. Clock modeling is then performed on the remodeled layout. Because the remodeled layout contains fewer latches than the original synthesized layout, the computational expense and time required for clock modeling (and hence, formal verification) on the remodeled layout can be significantly reduced over the requirements for clock modeling (and formal verification) on the original synthesized layout.

REFERENCES:
patent: 5539330 (1996-07-01), McDermid
patent: 5886904 (1999-03-01), Dai et al.
patent: 6587997 (2003-07-01), Chen et al.
patent: 2003/0120985 (2003-06-01), Slobodnik et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Latch modeling technique for formal verification does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Latch modeling technique for formal verification, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Latch modeling technique for formal verification will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3856485

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.