Electronic digital logic circuitry – Reliability
Reexamination Certificate
2010-09-09
2011-10-11
Tran, Anh (Department: 2819)
Electronic digital logic circuitry
Reliability
C326S012000, C326S015000, C326S093000
Reexamination Certificate
active
08035410
ABSTRACT:
A latch circuit includes a feedback circuit having inverter circuits and at least two input terminals and an input circuit for inputting input signals or signals having the same phase as the input signals to the input terminals of the feedback circuit in synchronization with a clock signal. In the feedback circuit section, only when the input signals or the signals having the same phase as the input signals are input to the at least two input terminals at the same time, positive feedback using a predetermined number of amplification stages is applied to the input terminals.
REFERENCES:
patent: 5504703 (1996-04-01), Bansal
patent: 6026011 (2000-02-01), Zhang
patent: 6327176 (2001-12-01), Li et al.
patent: 7038515 (2006-05-01), Rusu et al.
patent: 7212056 (2007-05-01), Belov
patent: 2006/0103442 (2006-05-01), Krueger
patent: 2006/0279343 (2006-12-01), Naffziger
patent: 4-170792 (1992-06-01), None
Tosaka Yoshiharu
Uemura Taiki
Arent & Fox LLP
Fujitsu Semiconductor Limited
Tran Anh
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