Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1990-10-29
1992-12-08
Evans, F. L.
Optics: measuring and testing
By particle light scattering
With photocell detection
356419, 372 32, G01J 345, G01N 2125, H01S 313
Patent
active
051702240
ABSTRACT:
This invention is provided with a wavelength selecting means for uses in selectively receiving beam in compliance with each of a reference beam and a measured beam in order to simplify a correction or comparison of oscillating wavelengths in the laser device and further to improve a reliability and a controlling responsive speed.
REFERENCES:
patent: 3999864 (1976-12-01), Mutter
Oeda Yasuo
Ohmata Ken
Shimazaki Kazuo
Terada Mitsugu
Terashi Yuichiro
Evans F. L.
Hantis K. P.
Mitsui Petrochemical Industries Ltd.
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