Semiconductor device manufacturing: process – Semiconductor substrate dicing – By electromagnetic irradiation
Reexamination Certificate
2006-07-18
2006-07-18
Smith, Matthew (Department: 2823)
Semiconductor device manufacturing: process
Semiconductor substrate dicing
By electromagnetic irradiation
C438S948000
Reexamination Certificate
active
07078319
ABSTRACT:
A method for separating individual optoelectronic devices, such as LEDs, from a wafer includes directing a laser beam having a width toward a major surface of the semiconductor wafer. The laser beam has an image with a first portion of a first energy per unit width and a second portion of a second energy per unit width less than the first energy. The laser beam image cuts into the first major surface of the semiconductor wafer to produce individual devices.
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Eliashevich Ivan
Gottfried Mark
Clark S. V.
Fay Sharpe Fagan Minnich & McKee LLP
GELcore LLC
Smith Matthew
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