Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate
2008-07-29
2008-07-29
Lyons, Michael A (Department: 2877)
Optics: measuring and testing
By light interference
For dimensional measurement
Reexamination Certificate
active
07405831
ABSTRACT:
An apparatus for assessing topology of a surface of a target including an optical source for generating a probe laser beam. The apparatus also includes a means for scanning the probe laser beam across at least a portion of the surface of the target and a beamsplitter for redirecting a return signal toward the means for detecting the return signal in a substantially quadrature condition. A quadrature interferometric method for determining the presence or absence of a target analyte in a sample comprising a laser probe beam having a wavelength λ and a waist woto probe at least a portion of a substrate having a reflecting surface that includes at least a first region having a layer of recognition molecules specific to the target analyte and a second region that does not include a layer of recognition molecules specific to the target analyte.
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Nolte David
Regnier Fred E.
Varma Manoj
Bose McKinney & Evans LLP
Lyons Michael A
Purdue Research Foundation
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