Optics: measuring and testing – By alignment in lateral direction
Patent
1999-05-25
2000-02-29
Kim, Robert H.
Optics: measuring and testing
By alignment in lateral direction
356400, G01B 1100
Patent
active
060316160
ABSTRACT:
A method and apparatus are provided for aligning first and second rotary members with a single alignment plane, such that respective axes about which the first and second rotary members rotate are substantially perpendicular to the alignment plane. A first fixture has a first lineal indicator mark and a line generator, which emits a planar light signal. The first fixture is engaged with the first rotary member to align the lineal indicator mark and the planar light signal in a fixed relation with respect to the axis of the first rotary member, perpendicular to the axis of the first rotary member. A second fixture is engaged with the second rotary member to align a reflective surface and a second lineal indicator mark mounted to the second fixture in fixed relation to the axis of the second rotary member. Then, the first and second rotary members are moved to align the planar light signal with the reflective surface and the second lineal indicator mark of the second fixture, such that the planar light signal overlays both the second lineal indicator mark and is reflected from the reflective surface to overlay the first lineal indicator mark of the first fixture. This aligns the respective axis of the first and second fixtures in parallel, and substantially perpendicular to the planar light signal which then defines single alignment plane.
REFERENCES:
patent: 5237390 (1993-08-01), Chaney
Handley Mark W.
Howison Gregory M.
Kim Robert H.
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