Laser production and product qualification via accelerated...

Details Laser production and product qualification via accelerated... Laser production and product qualification via accelerated...

2005-12-20

2005-12-20

Tang, Minh N. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S765010

Reexamination Certificate

active

06977517

ABSTRACT:
A method is provided for improving performance testing in semiconductor lasers via an accelerated life model. By using an accelerated life model, operating conditions for performance tests, such as burn-in procedures and wafer qualification, are optimized with reduced cost and effort. The method is also used to improve maintenance of optical networks containing semiconductor lasers.

REFERENCES:
patent: 4573255 (1986-03-01), Gordon et al.
patent: 5617036 (1997-04-01), Roff
patent: 5872881 (1999-02-01), Rossi et al.
patent: 2003/0074173 (2003-04-01), Monroe
Pamphlet for 2.5 G 1310 nm Fabry-PPerot Laser Diode,Demeter Technologies, Inc.,Jan. 11, 2002.
Strained Multi Quantum Well(SMQW)Laser Diode, Reliability Data, Agilent Technologies, 2000, no month.
News Release,Nortel Networks Announces Industry's First Telcordia-Qualified Widely tunable Laser, Apr. 30, 2002, www.nortelnetworks.com/corporate
ews
ewsrelease/2002b/04_30_02_m120_tunable_laster.html.

Affiliated with

Also associated with

Rating

Laser production and product qualification via accelerated... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Laser production and product qualification via accelerated..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Laser production and product qualification via accelerated... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3522650