Method and apparatus for alignment of a precision optical...

Details Method and apparatus for alignment of a precision optical... Method and apparatus for alignment of a precision optical...

2005-12-20

2005-12-20

Toatley, Jr., Gregory J. (Department: 2877)

Optics: measuring and testing

By light interference

For dimensional measurement

C356S511000

Reexamination Certificate

active

06977730

ABSTRACT:
Interferometric apparatus and methods for assembling and measuring highly precise optical assemblies such as triple corner cubes, and the like. The apparatus and methods use one or more interferometers that can simultaneously measure the shape, orientation, and distance to one or more surfaces.

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patent: 6195168 (2001-02-01), De Lega et al.
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patent: 2001/0043333 (2001-11-01), Groot et al.
patent: 2002/0109851 (2002-08-01), Deck
Peter G. Halverson, et al., Progress Towards Picometer Accuracy Laser Metrology For The Space Interferometry Mission, International Conference of Space Optics, ICSO Dec. 5, 6, 7, 2000, Toulouse, France.
Schmidtlin, Edouard, “Design, assembly and testing of the TCC's (Triple Corner Cubes) for MAM”, Jet Propulsion Laboratory, Interoffice Memorandum, Nov. 16, 1999.

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