Kerr effect apparatus

Details Kerr effect apparatus Kerr effect apparatus

1978-08-24

1981-05-05

McGraw, Vincent P.

Optics: measuring and testing

By polarized light examination

Of surface reflection

350375, G01J 404, G02F 105

Patent

active

042655439

ABSTRACT:
A miniature Kerr effect probe is described which may be used to examine surfaces of magnetic material during electroplating or vacuum deposition, without requiring a specially shaped bath or chamber.
The probe consists of a U-shaped core with adjacent pole tips of soft magnetic material wound with a coil to provide a magnetic field across the ends of the arms of the core which constitute probe tips. In use, these probe tips are placed adjacent to a surface being examined. Optic fibers are used to direct light to and from the surface.
The polarizer and analyzer required for Kerr work may be at the probe tips or remote from the probe tips due to the availability of optic fibers which will transmit polarized light without distortion. The light beam at the probe tips may be collimated or focussed by the optic fiber.

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