Thermal measuring and testing – Leak or flaw detection – With heating or cooling of specimen for test
Patent
1989-08-29
1991-10-01
Cuchlinski, Jr., William A.
Thermal measuring and testing
Leak or flaw detection
With heating or cooling of specimen for test
374124, 374137, 228105, G01N 2572, G01N 2171
Patent
active
050528165
ABSTRACT:
A plurality of lead wires such as those from an IC (an integrated circuit) is irradiated by a fan beam at same time. Infrared rays radiated from the portion which is irradiated by the fan beam and the periphery of the portion are detected so as to catch a thermogram exhibiting the temperature distribution. The thermogram is processed by image processing so as to produce a temperature distribution image. This image is visually compared with a standard temperature distribution-pattern on a display apparatus to judge whether soldering on those lead wires is defective or not.
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Nakamura Minoru
Oshiro Yasuhiro
Cuchlinski Jr. William A.
Denyo Kabushiki Kaisha
Worth W. Morris
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