Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2011-03-29
2011-03-29
Purvis, Sue A (Department: 2826)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257SE27103, C257SE21680, C438S257000
Reexamination Certificate
active
07915660
ABSTRACT:
A junction-free NAND flash memory is described, including a substrate, memory cells, source/drain inducing (SDI) gates electrically connected with each other, and a dielectric material layer. The memory cells are disposed on the substrate, wherein each memory cell includes a charge storage layer. Each SDI gate is disposed between two neighboring memory cells. The dielectric material layer is disposed between the memory cells and the SDI gates and between the SDI gates and the substrate.
REFERENCES:
patent: 6992929 (2006-01-01), Chen et al.
patent: 2006/0065921 (2006-03-01), Willer et al.
patent: 2006/0199333 (2006-09-01), Chu et al.
patent: 2007/0014155 (2007-01-01), Yoshino
Chen Shi-Hsien
Lin Shih-Hsiang
Wang Hsin-Heng
Wei Houng-Chi
Jianq Chyun IP Office
Powerchip Semiconductor Corp.
Purvis Sue A
Quinto Kevin
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