JTAG controlled self-repair after packaging

Details JTAG controlled self-repair after packaging JTAG controlled self-repair after packaging

2010-04-21

2010-11-09

Tabone, Jr., John J (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Replacement of memory spare location, portion, or segment

C714S711000, C714S718000, C714S726000, C714S727000, C365S201000, C365S225700

Reexamination Certificate

active

07831870

ABSTRACT:
An integrated circuit containing memory includes IEEE 1149.1 (JTAG) controlled self-repair system that permits permanent repair of the memory after the integrated circuit has been packaged. The JTAG controlled self-repair system allows a user to direct circuitry to blow fuses using an externally supplied voltage to electrically couple or isolate components to permanently repair a memory location with JTAG standard TMS and TCK signals. The system may optionally sequentially repair more than one memory location using a repair sequencer.

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