Jitter tolerance testing apparatus, systems, and methods

Details Jitter tolerance testing apparatus, systems, and methods Jitter tolerance testing apparatus, systems, and methods

2005-06-30

2009-06-23

Chung, Phung M (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Skew detection correction

C714S704000

Reexamination Certificate

active

07552366

ABSTRACT:
Apparatus, systems, methods, and articles may operate to move an output phase of a clock phase adjustment device associated with a master clock through a plurality of phase shifts relative to a phase of the master clock. A data integrity test may be performed on a serial data receive circuit clocked using an output phase of the clock phase adjustment device following each one of the plurality of phase shifts.

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