Jitter producing circuitry and methods

Details Jitter producing circuitry and methods Jitter producing circuitry and methods

2006-10-04

2010-12-07

Gaffin, Jeffrey A (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Skew detection correction

C714S706000

Reexamination Certificate

active

07849370

ABSTRACT:
To facilitate measurement of the jitter tolerance of circuitry such as serializer/deserializer (SERDES) circuitry, test circuitry is provided that can add jitter to a data signal. The jitter added is preferably controllable and variable with respect to such parameters as jitter frequency (i.e., how rapid is the jitter) and/or amplitude (i.e., how large or great is the amount of the jitter).

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