Jitter frequency determining system

Details Jitter frequency determining system Jitter frequency determining system

2008-01-25

2009-10-20

Nghiem, Michael P. (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

Reexamination Certificate

active

07606675

ABSTRACT:
A jitter frequency determining system is provided that includes a comparator, a clock source, a latching circuit, a memory device and a processor. The comparator is adapted to receive at least one output signal from a device under test and compare the output signal to an expected signal. The output signal has a repeating pattern. The clock source is adapted to produce a sampling clock based on user inputs. The clock source is further adapted to change the time between locally-in-order strobes to adjust the measurement bandwidth. The latching circuit is adapted to obtain samples of the output signal according to the sampling clock. The memory device is adapted to store the sampled data. The processor is adapted to analyze the stored data to determine jitter and to express jitter as a function of frequency.

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