Semiconductor device manufacturing: process – Formation of semiconductive active region on any substrate – Amorphous semiconductor
Reexamination Certificate
2007-08-14
2007-08-14
Sarkar, Asok Kumar (Department: 2891)
Semiconductor device manufacturing: process
Formation of semiconductive active region on any substrate
Amorphous semiconductor
C257S066000, C257S075000, C257SE33003, C257SE29292, C257SE21133, C438S187000, C438S482000, C438S487000
Reexamination Certificate
active
11099198
ABSTRACT:
A high-quality isotropic polycrystalline silicon (poly-Si) and a method for fabricating high quality isotropic poly-Si film are provided. The method includes forming a film of amorphous silicon (a-Si) and using a MISPC process to form poly-Si film in a first area of the a-Si film. The method then anneals a second area, included in the first area, using a Laser-Induced Lateral Growth (LILaC) process. In some aspects, a 2N-shot laser irradiation process is used as the LILaC process. In some aspects, a directional solidification process is used as the LILaC process. In response to using the MISPC film as a precursor film, the method forms low angle grain boundaries in poly-Si in the second area.
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Crowder Mark A.
Moriguchi Masao
Voutsas Apostolos T.
Ripma David C.
Sarkar Asok Kumar
Sharp Laboratories of America Inc.
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