Semiconductor device manufacturing: process – Formation of electrically isolated lateral semiconductive... – Recessed oxide by localized oxidation
Reexamination Certificate
2005-10-26
2008-12-16
Smith, Bradley K (Department: 2894)
Semiconductor device manufacturing: process
Formation of electrically isolated lateral semiconductive...
Recessed oxide by localized oxidation
C438S424000, C257SE21546
Reexamination Certificate
active
07465644
ABSTRACT:
A structure for electrically isolating semiconductor devices includes a semiconducting layer and a layer of aluminum oxide formed in a pattern over the semiconducting layer, where the pattern exposes a portion of the semiconducting layer. The structure further includes an electrical isolation region formed in the exposed portion of the semiconducting layer, where the isolation region does not substantially encroach a region beneath the layer of aluminum oxide.
REFERENCES:
patent: 6468865 (2002-10-01), Yang et al.
patent: 7202128 (2007-04-01), Orimoto et al.
patent: 2006/0035418 (2006-02-01), Yoshida et al.
Bell Scott
Chan Simon S.
Holbrook Allison
Jones Phillip
Qian Weidong
Advanced Micro Devices , Inc.
Harrity & Harrity LLP
Smith Bradley K
Spansion LLC
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