Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate
2006-01-24
2009-06-23
Nguyen, Cuong Q (Department: 2811)
Active solid-state devices (e.g., transistors, solid-state diode
Test or calibration structure
C257S235000, C257S238000
Reexamination Certificate
active
07550762
ABSTRACT:
An isolation circuit includes a first pad adapted to receive a control signal and a second pad adapted to receive another signal. A third pad is coupled to a microelectronic die and a device is provided to transfer the other signal from the second pad to the third pad in response to the control signal.
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Cowles Timothy B.
Lunde Aron T.
Micro)n Technology, Inc.
Nguyen Cuong Q
Schwegman Lundberg & Woessner, P.A.
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