Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Making electrical device
Patent
1985-08-05
1988-03-22
Schilling, Richard L.
Radiation imagery chemistry: process, composition, or product th
Imaging affecting physical property of radiation sensitive...
Making electrical device
430313, 430315, 430277, 430275, 430324, 430325, 430330, 430286, 522 97, 522181, 522168, 522182, 522100, 526246, 526245, 526270, 525922, G03C 500
Patent
active
047328436
ABSTRACT:
Linear fluorooligomers having at least two reactive end groups per polymer molecule are incorporated into radiation sensitive polymer systems which have improved continuous temperature resistance and low dielectric constant. The polymer systems can be applied as lacquers. Preferably perfluorated poly-ethers and perfluorated alkanes are used as starting compounds. The polymeric product is usable as a coating for the production of printed multi-layer wirings and economises on through-bores and additional copper intermeidate layers. A further field of application exists in the field of integrated semiconductor ciruits in VLSI-technology for the production of negative photo-resists.
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Hartmut, Steppan et al, "The Resist Technique-A Chemical Contribution to Electronics", Angewandte Chemie Int. Engl., vol. 21, No. 7, 1982, pp. 455-469.
Article by A. Ledwith in "IEEE Proceedings", vol. 130, Part 1, No. 5, Oct. 1983, on pp. 245 to 251.
Budde Klaus
Koch Friedrich
Quella Ferdinand
Hamilton Cynthia
Schilling Richard L.
Siemens Aktiengesellschaft
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