Ionization test for electrical verification

Details Ionization test for electrical verification Ionization test for electrical verification

2003-11-12

2010-10-05

Hollington, Jermele M (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

07808257

ABSTRACT:
A method and apparatus for the non-contact electrical test of both opens and shorts in electronic substrates. Top surface electrical test features are exposed to an ionization source under ambient conditions and the subsequent charge build up is measured as a drain current by probes contacting corresponding bottom surface features. Opens are detected by an absence of a drain current and shorts are detected by turning off the ionization source and re-measuring the bottom surface probes with a varying bias applied to each probe in the array.

REFERENCES:
patent: 3531716 (1970-09-01), Tarui et al.
patent: 3611074 (1971-10-01), Weichardt
patent: 3649830 (1972-03-01), Sato et al.
patent: 3764898 (1973-10-01), Bohlen et al.
patent: 3783283 (1974-01-01), Smith, Jr.
patent: 3796947 (1974-03-01), Harrod et al.
patent: 3970892 (1976-07-01), Wakalopulos
patent: 4053833 (1977-10-01), Malmberg et al.
patent: 4112299 (1978-09-01), Davis
patent: 4189642 (1980-02-01), Justus et al.
patent: 4326165 (1982-04-01), Szedon
patent: 4650333 (1987-03-01), Crabb et al.
patent: 4663526 (1987-05-01), Kamieniecki
patent: 4780680 (1988-10-01), Reuter et al.
patent: 4812756 (1989-03-01), Curtis et al.
patent: 4963738 (1990-10-01), Gundlach et al.
patent: 4985681 (1991-01-01), Brunner et al.
patent: 5179279 (1993-01-01), Millard et al.
patent: 5202623 (1993-04-01), LePage
patent: 5216362 (1993-06-01), Verkuil
patent: 5266892 (1993-11-01), Kimura
patent: 5417494 (1995-05-01), Kempa et al.
patent: 5485091 (1996-01-01), Verkuil
patent: 5508507 (1996-04-01), Nelson et al.
patent: 5587584 (1996-12-01), Bergen
patent: 5587664 (1996-12-01), Banitt et al.
patent: 5644223 (1997-07-01), Verkuil
patent: 5767693 (1998-06-01), Verkuil
patent: 5818239 (1998-10-01), Scaman
patent: 5883437 (1999-03-01), Maruyama et al.
patent: 5936408 (1999-08-01), Scaman
patent: 6043665 (2000-03-01), Nishioka et al.
patent: 6064845 (2000-05-01), Suzuki
patent: 6100698 (2000-08-01), Megerle et al.
patent: 6208499 (2001-03-01), Yonekawa et al.
patent: 6538462 (2003-03-01), Lagowski et al.

Affiliated with

Also associated with

Rating

Ionization test for electrical verification does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Ionization test for electrical verification, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Ionization test for electrical verification will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4187893