Ion-sensitive field effect transistor and method for...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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C257S350000

Reexamination Certificate

active

07321143

ABSTRACT:
An ion-sensitive field effect transistor includes a substrate on which there are formed a source region and a drain region. Above a channel region, the ion-sensitive field effect transistor has a gate with a sensitive layer including a metal oxide nitride mixture and/or a metal oxide nitride mixture compound.

REFERENCES:
patent: 5288563 (1994-02-01), Saito et al.
patent: 5465249 (1995-11-01), Cooper et al.
patent: 6225168 (2001-05-01), Gardner et al.
patent: 6483151 (2002-11-01), Wakabayashi et al.
patent: 6560142 (2003-05-01), Ando
patent: 6682973 (2004-01-01), Paton et al.
patent: 2001/0025971 (2001-10-01), Powell
patent: 2002/0008261 (2002-01-01), Nishiyama
patent: 2002/0022357 (2002-02-01), Iijima et al.
patent: 2002/0149065 (2002-10-01), Koyama et al.
patent: 2003/0064567 (2003-04-01), Chaudhry et al.
patent: 2003/0107073 (2003-06-01), Iijima et al.
patent: 2003/0211718 (2003-11-01), Koyama et al.
patent: 2004/0120092 (2004-06-01), Jaussi et al.
patent: 2004/0235285 (2004-11-01), Kang et al.
patent: 2005/0218462 (2005-10-01), Ahn et al.
patent: 2006/0051925 (2006-03-01), Ahn et al.
patent: 2007/0063295 (2007-03-01), Jeon et al.
patent: PCT/EP2003/002359 (2003-03-01), None
patent: WO 94/22006 (1994-09-01), None
patent: WO 2004/079355 (2004-09-01), None
S. Wakida, S. Mochizuki, R. Makabe, A. Kawahara, M. Yamane, S. Takasuka, K. Higashi; “PH-Sensitive ISFETS Based on Titanium Nitride and Their Application to Battery Monitor;” Material Chemistry Department, Material Physics Department, Government Idustrial Research Institute, Osaka, Japan; pp. 222-224, date unknown.
I. Gracia, C. Cane, M. Lozano, J. Esteve; “Test Structures for ISFET Chemical Sensors;” Proc. IEEE 1992 Int. Conference on Microelectronic Test Structures, vol. 5, Mar. 1992; pp. 156-159.
Database WPI; Section CH, Week 198521; Derwent Publications Ltd., London, GB, date unknown.
International Preliminary Examination Report, date unknown.

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