Ion scattering spectrometer with modified bias

Details Ion scattering spectrometer with modified bias Ion scattering spectrometer with modified bias

1977-01-12

1978-08-15

Smith, Alfred E.

Radiant energy

Electron energy analysis

250309, H01J 3500

Patent

active

041075269

ABSTRACT:
An ion scattering spectrometer (ISS) providing enhanced sensitivity, reduced background, and preferential detection of low-mass scattered ions over that of high-mass sputtered ions is disclosed. These advantages are accomplished by a biasing arrangement which maintains a potential difference between the analyzer exit and the detector input at less than 30 volts and substantially eliminates the high potential provided on detector inputs of prior art ion scattering spectrometers which attracted and thereby accelerated ions prior to impinging on the inputs.

REFERENCES:
patent: 3735128 (1973-05-01), Palmberg
patent: 3742214 (1973-06-01), Helmer et al.
patent: 3916190 (1975-10-01), Valentine et al.
patent: 3939344 (1976-02-01), McKinney

Affiliated with

Also associated with

Rating

Ion scattering spectrometer with modified bias does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Ion scattering spectrometer with modified bias, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Ion scattering spectrometer with modified bias will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1437744