Radiant energy – Irradiation of objects or material – Irradiation of semiconductor devices
Reexamination Certificate
2006-09-26
2006-09-26
Nguyen, Kiet T. (Department: 2881)
Radiant energy
Irradiation of objects or material
Irradiation of semiconductor devices
C250S397000
Reexamination Certificate
active
07112810
ABSTRACT:
In an ion implanting apparatus and an ion implanting method using the same, the ion implanting apparatus includes a disk chamber containing a rotatable disk, a wafer mounted on the rotatable disk, and a charge sensor for monitoring a charged state of the wafer, the charge sensor being fixed to the disk chamber to be adjacent to and facing a surface of the wafer. An output of the charge sensor may be used as feedback to control the charged state of the wafer.
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Cha Sang-Yeob
Chae Seung-Ki
Han Jae-Hyun
Hong Hyung-Sik
Im Tae-Sub
Lee & Morse P.C.
Leyabourne James J.
Nguyen Kiet T.
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