Ion implantation ion source, system and method

Radiant energy – Ion generation – Field ionization type

Reexamination Certificate

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Details

C315S111810

Reexamination Certificate

active

07732787

ABSTRACT:
An ion source is disclosed that is capable of providing ions of decaborane in commercial ion current levels to the ion extraction system of an ion implanter is provided, the ion source comprising an ionization chamber defined by walls enclosing an ionization volume, there being an ion extraction aperture in a side wall of the ionization chamber, arranged to enable the ion current to be extracted from the ionization volume by an extraction system, an electron gun mounted on a support that is outside of and thermally isolated from the walls of the ionization chamber, the ion extraction aperture plate is biased to a negative voltage with respect to the ionization chamber to further increase the drift velocity of the ions, and hence the maximum obtainable current in the resulting ion beam.

REFERENCES:
patent: 2700107 (1955-01-01), Luce
patent: 2773348 (1956-12-01), Grieshaber et al.
patent: 4261762 (1981-04-01), King
patent: 4531077 (1985-07-01), Dagenhart
patent: 4902572 (1990-02-01), Horne et al.
patent: 5296713 (1994-03-01), Tanaka
patent: 5320982 (1994-06-01), Tsubone et al.
patent: 5523652 (1996-06-01), Sferlazzo et al.
patent: 5556204 (1996-09-01), Tamura et al.
patent: 5633506 (1997-05-01), Blake
patent: 5741711 (1998-04-01), Amirav et al.
patent: 5895923 (1999-04-01), Blake
patent: 6111260 (2000-08-01), Dawson et al.
patent: 6452338 (2002-09-01), Horsky
patent: 6476399 (2002-11-01), Harrington et al.
patent: 7107929 (2006-09-01), Horsky et al.
patent: 2003/0230986 (2003-12-01), Horsky
patent: 2004/0188631 (2004-09-01), Horsky
patent: 2004/0245476 (2004-12-01), Horsky
patent: 2005/0051096 (2005-03-01), Horsky
patent: 2005/0269520 (2005-12-01), Horsky
patent: 2007/0278417 (2007-12-01), Horsky et al.
patent: PCT/US 2000/33786 (2000-12-01), None
patent: WO 01/43157 (2001-06-01), None

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