Ion current measuring arrangement

Details Ion current measuring arrangement Ion current measuring arrangement

1976-07-20

1977-07-19

Borchelt, Archie R.

Radiant energy

Ionic separation or analysis

Static field-type ion path-bending selecting means

250397, H01J 3726, H01J 3936, G01N 2762

Patent

active

040367770

ABSTRACT:
This measuring arrangement minimizes the influence of disuniformities in the first dynode, struck by the beam's ions, of the electron multiplier used in the arrangement. The beam F whose current is to be measured is expanded, for example using a divergent lens, between the analyzer slot and said dynode. In a variant embodiment, the beam is imparted a rapid oscillatory motion which causes it to scan the dynode.

REFERENCES:
patent: 3845304 (1974-10-01), Tamura et al.

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