Static information storage and retrieval – Read/write circuit – Including reference or bias voltage generator
Reexamination Certificate
2007-03-14
2009-02-17
Auduong, Gene N. (Department: 2827)
Static information storage and retrieval
Read/write circuit
Including reference or bias voltage generator
C365S189070
Reexamination Certificate
active
07492646
ABSTRACT:
An internal voltage generator of a semiconductor memory device is capable of changing driving abilities between standby and active modes, to respond faster in the active mode and prevent a leakage current in the standby mode. The internal voltage generator of a semiconductor memory device comprises a driving controller for generating drive control signals having information about standby and active modes, a first voltage generator enabled by the drive control signals for comparing an internal voltage with a reference voltage in the standby and active modes, a first driver for generating the internal voltage according to a comparison performed by the first voltage generator, a second voltage generator enabled by the drive control signal for comparing the internal voltage with the reference voltage in the active mode, and a second driver for generating the internal voltage according to a comparison performed by the second voltage generator.
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Korean Office Action, with English translation, issued in Korean Patent Application No. KR 10-2006-0060051, mailed Aug. 28, 2007.
Lee Jong-Chern
Shin Sun-Hye
Auduong Gene N.
Hynix / Semiconductor Inc.
McDermott Will & Emery LLP
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