Static information storage and retrieval – Read/write circuit – Including reference or bias voltage generator
Reexamination Certificate
2009-06-29
2011-11-01
Nguyen, Tuan T. (Department: 2824)
Static information storage and retrieval
Read/write circuit
Including reference or bias voltage generator
C365S189050, C365S189110, C365S189070
Reexamination Certificate
active
08050112
ABSTRACT:
An internal voltage generation circuit includes a temperature detection unit which detects an internal temperature of a semiconductor memory device and generates a temperature signal, a driving control signal generation unit which receives the temperature signal and generates first and second driving control signals, and an internal voltage generation unit which receives the first and second driving control signals and generates an internal voltage.
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Cooper & Dunham LLP
Hynix / Semiconductor Inc.
Nguyen Tuan T.
White John P.
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