Intermetallic solder with low melting point

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified material other than unalloyed aluminum

Reexamination Certificate

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Details

C228S180500, C228S056300

Reexamination Certificate

active

11229184

ABSTRACT:
Embodiments of the invention provide a low-melting temperature comprised primarily of a bulk intermetallic phase material. This solder may allow reflow with less of a chance to damage microelectronic devices due to coefficient of thermal expansion mismatches, and may be creep resistant even at high homologous temperatures.

REFERENCES:
patent: 6063213 (2000-05-01), Ogasa
patent: 6319617 (2001-11-01), Jin et al.
patent: 2002/0078559 (2002-06-01), Buchwalter et al.
patent: 2002/0155661 (2002-10-01), Massingill et al.
patent: 2003/0168130 (2003-09-01), Shohji
patent: 2004/0112478 (2004-06-01), Bieler et al.
Chowhan, Kishan Singh A Study of Lead -Free Soldering and Assembly for RoHS Compliance, TechOnLine Published Apr. 12, 2005 http://www.techonline.com/community/ed—resource?feature—article/37904?print.
Daewoong Suh, “Soldering an Electronics Package to a Motherboard”, U.S. Appl. No. 10/808,192, filed Mar. 24, 2004.
Chad A. Kumaus et al., “Reactive Gettering in Phase Change Solders to Inhibit Oxidation at Contact Surfaces”, U.S. Appl. No. 10/954,646, filed Sep. 29, 2004.
Ai Ling Low, “Substrate Grooves to Reduce Underfill Fillet Bridging”, U.S. Appl. No. 10/954,959, filed Sep. 29, 2004.
Daewoong Suh, “Solders with Intermetallic Phases, Solder Bumps Made Thereof, Packages Containing Same, and Methods of Assembling Packages Therewith”, U.S. Appl. No. 11/173,224, filed Jun. 30, 2005.
Daewoong Suh, “Bulk Metallic Glass Solder Material”, U.S. Appl. No. 11/203,546, filed Aug. 12, 2005.

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