Thermal measuring and testing – Temperature measurement – Nonelectrical – nonmagnetic – or nonmechanical temperature...
Patent
1992-04-27
1993-10-05
Cuchlinski, Jr., William A.
Thermal measuring and testing
Temperature measurement
Nonelectrical, nonmagnetic, or nonmechanical temperature...
374120, 356 43, 356351, G01J 558, G01K 1100
Patent
active
052498654
ABSTRACT:
An interferonmetric temperature measurement system is described for determining the temperature of a sample. The system comprises three detectors for measuring various intensities of a beam of electromagnetic radiation reflected off the sample and circuitry for determining the temperature from the intensities. The detectors measure the intensity of the beam and two orthogonally polarized components of the beam.
REFERENCES:
patent: 3422678 (1969-01-01), Murray
patent: 3462224 (1969-08-01), Woods et al.
patent: 3950987 (1976-04-01), Slezinger et al.
patent: 4140393 (1979-02-01), Cetas
patent: 4498765 (1985-02-01), Herve
patent: 4707147 (1987-11-01), Aoki et al.
patent: 4970385 (1990-11-01), Tatsuno et al.
patent: 5011295 (1991-04-01), Krishnan et al.
Duncan Walter M.
Henck Steven A.
Paranjpe Ajit P.
Cuchlinski Jr. William A.
Donaldson Richard C.
Gutierrez Diego F. F.
Hiller William E.
Rutkowski Peter T.
LandOfFree
Interferometric temperature measurement system and method does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Interferometric temperature measurement system and method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Interferometric temperature measurement system and method will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-998702