Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1987-03-23
1988-08-16
Willis, Davis L.
Optics: measuring and testing
By particle light scattering
With photocell detection
356338, 356340, 356364, G01B 902
Patent
active
047640138
ABSTRACT:
Interferometric apparatus and method for detection and characterization of particles using light scattered therefrom. Differential phase measurements on scattered light from particles are possible using the two-frequency Zeeman effect laser which emits two frequencies of radiation 250 kHz apart. Excellent discrimination and reproducibility for various pure pollen and bacterial samples in suspension have been observed with a single polarization element. Additionally, a 250 kHz beat frequency was recorded from an individual particle traversing the focused output from the laser in a flow cytometer.
REFERENCES:
patent: 3612688 (1921-10-01), Liskowitz
patent: 4306809 (1981-12-01), Azzam
Hunt et al., "A Polarization-Modulated Light Scattering Instrument for Determining Liquid Aerosol Properties", Proc Ico Conf. Methods in Sci. and Incl. Meas., Tokyo, 1974, pp. 435-410.
Bickel et al., "Application of Polarization Effects in Light Scattering: A New Biophysical Tool", Proc. Natl. Acad. Sci., USA, vol. 25, No. 2, pp. 486-490, 2/76.
Roger G. Johnston et al., "Phase Differential Scattering from Microspheres", Appl. Opt. 25, 3566-3572 (Oct. 1986).
Freund Samuel M.
Hightower Judson R.
Koren Matthew W.
The United States of America as represented by the United States
Willis Davis L.
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