Interferometric analysis method for the manufacture of...

Optics: measuring and testing – Angle measuring or angular axial alignment – Automatic following or aligning while indicating measurement

Reexamination Certificate

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Reexamination Certificate

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07630067

ABSTRACT:
The present invention features a method to determine relative spatial parameters between two coordinate systems, which may be a mold and a region of a substrate in which mold is employed to generate a pattern. The method includes sensing relative alignment between the two coordinate systems at multiple points and determines relative spatial parameters therebetween. The relative spatial parameters include a relative area and a relative shape.

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