Interface circuit coupling semiconductor test apparatus with...

Details Interface circuit coupling semiconductor test apparatus with... Interface circuit coupling semiconductor test apparatus with...

2005-10-11

2005-10-11

Tang, Minh N. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S765010

Reexamination Certificate

active

06954079

ABSTRACT:
The interface circuit includes n buffer circuits, switches for connecting an external pin of a tester to input nodes of n buffer circuits and connecting output nodes of n buffers respectively to n DUTs when a signal is provided from the tester to n DUTs, and successively connecting n DUTs to the external pin of the tester by a prescribed time period when voltage-ampere characteristics of n DUTs are measured. Therefore the number of devices that can be measured by the tester at a time can be increased by n times. As a result, the test cost can be reduced and the test accuracy can be improved.

REFERENCES:
patent: 3772595 (1973-11-01), De Wolf et al.
patent: RE31056 (1982-10-01), Chau et al.
patent: 5604679 (1997-02-01), Slater
patent: 5794175 (1998-08-01), Conner
patent: 6339338 (2002-01-01), Eldridge et al.
patent: 6493840 (2002-12-01), Shacham et al.
patent: 6499121 (2002-12-01), Roy et al.
patent: 6753693 (2004-06-01), Seo et al.
patent: 2002-5999 (2002-01-01), None
patent: 2002-107406 (2002-04-01), None
patent: 2002-189058 (2002-07-01), None

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