Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2006-04-03
2011-11-08
Warren, Matthew E (Department: 2815)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S301000, C257S302000, C257S303000, C257S304000, C257S305000, C257S306000, C257S308000, C257S309000, C257S532000, C257S535000, C257S758000, C257SE27016, C257SE27048
Reexamination Certificate
active
08053824
ABSTRACT:
Apparatuses and methods for increasing well distributed, high quality-factor on-chip capacitance of integrated circuit devices are disclosed. In one aspect, an integrated circuit device structure includes a first metal line implemented on a metallization layer of a semiconductor substrate, the first metal line having a first set of metal fingers extending therefrom; and a second metal line electrically isolated from the first metal line, the second metal line having a second set of metal fingers extending therefrom, the first set of metal fingers and the second set of metal fingers capacitively coupled. The basic structure of metal lines with interlocking metal fingers may be repeated on multiple adjacent metallization layers, with the metal lines oriented either in parallel or perpendicular.
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Howard Steve
Winn Greg
Abhyanker, P.C. Raj
Chen David
LSI Corporation
Warren Matthew E
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