Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate
2011-04-26
2011-04-26
Tran, Minh-Loan T (Department: 2826)
Semiconductor device manufacturing: process
Coating with electrically or thermally conductive material
To form ohmic contact to semiconductive material
C438S613000, C438S614000, C257S779000, C257S781000, C257SE23021, C257SE21509
Reexamination Certificate
active
07932169
ABSTRACT:
An interconnection structure suitable for flip-chip attachment of microelectronic device chips to packages, comprising a two, three or four layer ball-limiting metallurgy including an adhesion/reaction barrier layer, and having a solder wettable layer reactive with components of a tin-containing lead free solder, so that the solderable layer can be totally consumed during soldering, but a barrier layer remains after being placed in contact with the lead free solder during soldering. One or more lead-free solder balls is selectively situated on the solder wetting layer, the lead-free solder balls comprising tin as a predominant component and one or more alloying components.
REFERENCES:
patent: 7410833 (2008-08-01), Fogel et al.
patent: 2005/0224966 (2005-10-01), Fogel et al.
Belanger Luc
Buchwalter Leena Paivikki
Buchwalter Stephen L.
Giri Ajay P.
Griffith Jonathan H.
Beck Thomas A.
Cruz Leslie Pilar
International Business Machines - Corporation
Morris Daniel P.
Tran Minh-Loan T
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