Interconnect structures in a semiconductor device and...

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

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C438S597000, C438S686000, C438S660000, C438S637000, C438S699000, C438S644000, C438S648000, C438S650000, C438S658000, C438S661000, C438S687000, C438S630000, C438S655000, C438S682000

Reexamination Certificate

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07033930

ABSTRACT:
Processes for fabricating a semiconductor device are described herein. In one aspect of the invention, an exemplary process includes forming an interface layer overlying the device substrate, forming a silver layer overlying the interface layer, annealing the substrate to form an intermetallic layer between the silver layer and the interface layer, the silver layer is in intimate contact with the intermetallic layer, and forming a protection layer overlying the silver layer. Other interconnect structures and processes are also described.

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